Record link: 
http://hdl.handle.net/20.500.12708/219506
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Title: 
PDE-based Bayesian Inversion in Nanoelectronics
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Citation: 
Taghizadeh, L. (2025). PDE-based Bayesian Inversion in Nanoelectronics. In European Conference on Numerical Mathematics and Advanced Applications 2025 : Book of Abstracts (pp. 162–162).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Taghizadeh, Leila 
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Organisational Unit: 
E101-03-2 - Forschungsgruppe Unsicherheitsquantifizierung 
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Published in: 
European Conference on Numerical Mathematics and Advanced Applications 2025 : Book of Abstracts 
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Date (published): 
4-Sep-2025
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Event name: 
European Conference on Numerical Mathematics and Advanced Applications (ENUMATH 2025) 
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Event date: 
1-Sep-2025 - 5-Sep-2025
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Event place: 
Heidelberg, Germany
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Number of Pages: 
1
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Keywords: 
Uncertainty quantification; Infinite-dimensional Bayesian inverse problem; Markov chain Monte Carlo methods; semiconductor devices
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Project title: 
Rechnerische Unsicherheitsquantifizierung in Nanotechnologie: V 1000-N (FWF - Österr. Wissenschaftsfonds) 
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Research Areas: 
Mathematical and Algorithmic Foundations: 100%
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Science Branch: 
1010 - Mathematik: 100%
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Appears in Collections:
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