Record link: 
http://hdl.handle.net/20.500.12708/222122
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Title: 
Measurement and evaluation of LA-ICP-MS depth profiles as 2D (pseudo) cross sections for investigating layered sample structures
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Citation: 
Willner, J., Gibbs, D. K., Limbeck, A., & Podsednik, M. (2025, March 7). Measurement and evaluation of LA-ICP-MS depth profiles as 2D (pseudo) cross sections for investigating layered sample structures [Poster Presentation]. 20th European Winter Conference on Plasma Spectrochemistry (EWCPS 2025), Berlin, Germany.
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Publication Type: 
Presentation - Poster Presentation
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Language: 
English
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Authors: 
Willner, Jakob 
Gibbs, David Ken 
Limbeck, Andreas 
Podsednik, Maximilian 
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Organisational Unit: 
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie 
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Date (published): 
7-Mar-2025
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Event name: 
20th European Winter Conference on Plasma Spectrochemistry (EWCPS 2025) 
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Event date: 
2-Mar-2025 - 7-Mar-2025
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Event place: 
Berlin, Germany
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Keywords: 
LA-ICP-MS; Depth profiling
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Research Areas: 
Materials Characterization: 100%
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Science Branch: 
1040 - Chemie: 100%
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