Rätzel, D., Beltrán-Romero, S., Gaida, M., Haslinger, P., Löffler, S., & Nimmrichter, S. (2025). Theory of Spin Resonance Spectroscopy in an Electron Microscope. In Electron Beam Spectroscopy for Nanophotonics 2025 : Book of Abstracts (pp. 70–70). https://doi.org/10.34726/11542
E141-02 - Forschungsbereich Atom Physics and Quantum Optics E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
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Published in:
Electron Beam Spectroscopy for Nanophotonics 2025 : Book of Abstracts
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Date (published):
2025
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Event name:
Electron Beam Spectroscopy for Nanophotonics 2025 (EBSN 2025)
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Event date:
29-Oct-2025 - 31-Oct-2025
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Event place:
Castelldefels, Spain
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Number of Pages:
1
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Keywords:
spin resonance spectroscopy
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Abstract:
Coherent spin resonance methods, such as nuclear magnetic resonance and electron spin resonance spectroscopy, have led to spectrally highly sensitive, non-invasive quantum imaging techniques. In this talk, I will present joint theoretical work with my collaborators* on a pump- probe spin resonance spectroscopy approach, designed for electron microscopy, based on microwave pump fields and electron probes [1]. Starting from the description of the coupling of free-electrons and localized sample spins, I will introduce the general method and discuss the size of the effect, in particular, the phase shift on the electron wave function and the corresponding deflection angle. I will also present a framework for the simulation of spin resonance spectroscopy in Transmission Electron Microscopy (TEM) that we have recently developed [2] and discuss our results on the quantum metrological precision limits associated with the technique and the optimal measurement strategy [3]. Notably, state-of-the-art TEM provides the means to detect signals almost as small as that due to a single electron spin in principle. This could enable state-selective observation of spin dynamics on the nanoscale.
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Research facilities:
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie
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Research Areas:
Quantum Metrology and Precision Measurements: 100%