Record link: 
http://hdl.handle.net/20.500.12708/222644
https://doi.org/10.34726/11632
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Title: 
Towards Quantum Computer-Enhanced Measurements in Electron Microscopy
en
Citation: 
Hornof, D., Zanetti, M., Jungwirth, N., Seifner, M. S., Schindler, P., Juffmann, T., & Haslinger, P. (2025). Towards Quantum Computer-Enhanced Measurements in Electron Microscopy. In Electron Beam Spectroscopy for Nanophotonics 2025 : Book of Abstracts (pp. 56–56). https://doi.org/10.34726/11632
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reposiTUm DOI: 
10.34726/11632
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CatalogPlus: 
AC17737595
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Publication Type: 
Inproceedings - Abstract Book Contribution
en
Language: 
English
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Authors: 
Hornof, Dominik 
Zanetti, M. 
Jungwirth, N. 
Seifner, Michael Stanislaus 
Schindler, P. 
Juffmann, Thomas 
Haslinger, Philipp 
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Organisational Unit: 
E141-02 - Forschungsbereich Atom Physics and Quantum Optics 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
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Published in: 
Electron Beam Spectroscopy for Nanophotonics 2025 : Book of Abstracts 
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Date (published): 
30-Oct-2025
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Event name: 
Electron Beam Spectroscopy for Nanophotonics 2025 (EBSN 2025) 
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Event date: 
29-Oct-2025 - 31-Oct-2025
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Event place: 
Castelldefels, Spain
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Number of Pages: 
1
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Keywords: 
Electron Microscopy; quantum computer
en
Research facilities: 
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie 
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Research Areas: 
Quantum Metrology and Precision Measurements: 100%
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Science Branch: 
1030 - Physik, Astronomie: 100%
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License: 
CC BY-NC-ND 4.0 CC BY-NC-ND 4.0
de
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