Record link: 
http://hdl.handle.net/20.500.12708/224086
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Title: 
Geometry-Influenced Exchange Bias in 3D Ramped Microwires
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Citation: 
Singh, B., Singh, A., Mikulik, S., Jurczyk, J. M., Neu, V., & Fernandez-Pacheco Chicon, A. (2025, August 25). Geometry-Influenced Exchange Bias in 3D Ramped Microwires [Poster Presentation]. 14th Joint European Magnetic Symposia (JEMS 2025), Frankfurt am Main, Germany.
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Publication Type: 
Presentation - Poster Presentation
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Language: 
English
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Authors: 
Singh, Balram 
Singh, Aman 
Mikulik, Stefan 
Jurczyk, Jakub Mateusz 
Neu, Volker 
Fernandez-Pacheco Chicon, Amalio 
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Organisational Unit: 
E134-06 - Forschungsbereich Physics of three-dimensional Nanomaterials 
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Date (published): 
25-Aug-2025
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Event name: 
14th Joint European Magnetic Symposia (JEMS 2025) 
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Event date: 
24-Aug-2025 - 29-Aug-2025
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Event place: 
Frankfurt am Main, Germany
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Keywords: 
3D microstructures; Exchange bias; two-photon lithography
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Project (external): 
ERC
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Project ID: 
101001290 (3DNANOMAG)
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Research Areas: 
Materials Characterization: 80%
Surfaces and Interfaces: 20%
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Science Branch: 
1030 - Physik, Astronomie: 100%
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Appears in Collections:
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