<div class="csl-bib-body">
<div class="csl-entry">Wieland, D. (2026). <i>Hard switching reliability and short circuit robustness of lateral high voltage GaN HEMTs</i> [Dissertation, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2026.137790</div>
</div>
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dc.identifier.uri
https://doi.org/10.34726/hss.2026.137790
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/225277
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dc.language
English
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dc.language.iso
en
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dc.rights.uri
http://rightsstatements.org/vocab/InC/1.0/
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dc.subject
GaN
en
dc.subject
GaN HEMT
en
dc.subject
short circuit
en
dc.subject
short circuit robustness
en
dc.subject
hole injection
en
dc.subject
GaN reliability
en
dc.title
Hard switching reliability and short circuit robustness of lateral high voltage GaN HEMTs
