Record link: 
https://doi.org/10.34726/hss.2026.137790
http://hdl.handle.net/20.500.12708/225277
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Title: 
Hard switching reliability and short circuit robustness of lateral high voltage GaN HEMTs
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Citation: 
Wieland, D. (2026). Hard switching reliability and short circuit robustness of lateral high voltage GaN HEMTs [Dissertation, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2026.137790
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reposiTUm DOI: 
10.34726/hss.2026.137790
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CatalogPlus: 
AC17755386
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Publication Type: 
Thesis - Dissertation
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Language: 
English
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Authors: 
Wieland, Dominik 
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Advisor: 
Pogany, Dionyz 
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Organisational Unit: 
E362 - Institut für Festkörperelektronik 
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Date (published): 
2026
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Number of Pages: 
140
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Keywords: 
GaN; GaN HEMT; short circuit; short circuit robustness; hole injection; GaN reliability
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License: 
In Copyright
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