Record link: 
http://hdl.handle.net/20.500.12708/226314
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Title: 
Electron-Electron Scattering in Monte Carlo-based Device Simulations
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Citation: 
Gull, J., & Kosina, H. (2025). Electron-Electron Scattering in Monte Carlo-based Device Simulations. In Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN) (pp. 119–120). http://hdl.handle.net/20.500.12708/226314
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Gull, Josef 
Kosina, Hans 
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Organisational Unit: 
E360-01 - Forschungsbereich Mikroelektronik 
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Published in: 
Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN) 
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Date (published): 
Dec-2025
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Event name: 
International Workshop on Computational Nanotechnology (IWCN 2025) 
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Event date: 
19-May-2025 - 20-May-2025
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Event place: 
Salt Lake City, UT, United States of America (the)
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Number of Pages: 
2
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Keywords: 
hot carriers; electron-electron interaction; Monte Carlo method; statistical enhancement; device simulation
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Project title: 
Simulation Nanoelektronischer Bauelemente: 880672 (FFG - Österr. Forschungsförderungs- gesellschaft mbH) 
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Research Areas: 
Nanoelectronics: 50%
Modeling and Simulation: 50%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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