Record link: 
http://hdl.handle.net/20.500.12708/231289
-
Title: 
Plansee Meeting : Towards Advanced Manufacturing Cells
en
Citation: 
Bleicher, F., Wallner, B., Habersohn, C., Bodur, O., Kügerl, L., Greitler, J.-A., Wurm, F., Badhan, T. J., & Trautner, T. (2026, April 10). Plansee Meeting : Towards Advanced Manufacturing Cells [Presentation]. Plansee Meeting: Towards Advanced Manufacturing Cells, Wien, Austria. http://hdl.handle.net/20.500.12708/231289
-
Publication Type: 
Presentation - Presentation
en
Language: 
German
-
Authors: 
Bleicher, F. 
Wallner, B. 
Habersohn, Christoph 
Bodur, Osman 
Kügerl, Lukas 
Greitler, Julian-Amon 
Wurm, Florian 
Badhan, Tanmay Jitendra 
Trautner, T. 
-
Organisational Unit: 
E311-01-4 - Forschungsgruppe Fertigungsmesstechnik und adaptronische Systeme 
E311-01-1 - Forschungsgruppe Fertigungstechnologie 
E311-01-3 - Forschungsgruppe Steuerungstechnik und integrierte Systeme 
E311-01-2 - Forschungsgruppe Werkzeugmaschinen 
-
Date (published): 
10-Apr-2026
-
Event name: 
Plansee Meeting: Towards Advanced Manufacturing Cells 
en
Event date: 
10-Apr-2026
-
Event place: 
Wien, Austria
-
Keywords: 
Advanced Manufacturing Cells; Autonomous Mobile Robots; Sensor-Integrated Tooling; ICOtronic; Adaptive Control; Sensorised Clamping System; Zero-Point Clamping; CAM in the Loop; Private 5G Network; WGP Autonomy Levels; Plansee Group; Ceratizit
en
Additional information: 
Vortrag von Univ.-Prof. Dr. Friedrich Bleicher beim Plansee Meeting 'Towards Advanced Manufacturing Cells' am TU Wien IFT TEC-Lab (10. April 2026) in Kooperation mit der Plansee Group (Plansee SE / CERATIZIT). Beinhaltet Ergebnisse aus dem FFG-Projekt GigaBot (FO999917955 / TISS-PDB: 2561070) und IFT-Spanntechnikforschung.
-
Research Areas: 
Digital Transformation in Manufacturing: 50%
Automation and Robotics: 30%
Sensor Systems: 20%
-
Science Branch: 
2030 - Maschinenbau: 70%
1020 - Informatik: 10%
2020 - Elektrotechnik, Elektronik, Informationstechnik: 20%
-
Appears in Collections:
Presentation

Show full item record

Google ScholarTM

Check