<div class="csl-bib-body">
<div class="csl-entry">Kuiper, S., & Schitter, G. (2011). Improving the Imaging Speed of AFM with Modern Control Techniques. In E. Eleftheriou & S. O. R. Moheimani (Eds.), <i>Control Technologies for Emerging Micro and Nanoscale Systems</i> (pp. 83–100). Springer-Verlag, Berlin-Heidelberg. https://doi.org/10.1007/978-3-642-22173-6_5</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/27224
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dc.description.abstract
In Atomic Force Microscopy (AFM), the dynamics and non-linearities of the positioning stage are major sources of image artifacts and distortion, especially when imaging at high-speed. This contribution discusses some recent development to compensate for these adverse effects of the positioning stage dynamics in high-speed AFM by utilizing modern control methods. The improvements on both the lateral scanning motion and in controlling the tip-sample interaction force are demonstrated to allow significantly faster, and more accurate AFM imaging.
en
dc.publisher
Springer-Verlag, Berlin-Heidelberg
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dc.title
Improving the Imaging Speed of AFM with Modern Control Techniques
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dc.type
Buchbeitrag
de
dc.type
Book Contribution
en
dc.relation.publication
Control Technologies for Emerging Micro and Nanoscale Systems
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dc.relation.isbn
978-3-642-22173-6
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dc.relation.doi
10.1007/978-3-642-22173-6
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dc.relation.issn
0170-8643
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dc.description.startpage
83
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dc.description.endpage
100
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dc.type.category
Edited Volume Contribution
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dc.relation.eissn
1610-7411
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dc.publisher.place
Berlin-Heidelberg
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tuw.booktitle
Control Technologies for Emerging Micro and Nanoscale Systems