Kuiper, S., & Schitter, G. (2011). Improving the Imaging Speed of AFM with Modern Control Techniques. In E. Eleftheriou & S. O. R. Moheimani (Eds.), Control Technologies for Emerging Micro and Nanoscale Systems (pp. 83–100). Springer-Verlag, Berlin-Heidelberg. https://doi.org/10.1007/978-3-642-22173-6_5
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Book Title:
Control Technologies for Emerging Micro and Nanoscale Systems
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Related Publication(s):
Control Technologies for Emerging Micro and Nanoscale Systems
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Abstract:
In Atomic Force Microscopy (AFM), the dynamics and non-linearities of the positioning stage are major sources of image artifacts and distortion, especially when imaging at high-speed. This contribution discusses some recent development to compensate for these adverse effects of the positioning stage dynamics in high-speed AFM by utilizing modern control methods. The improvements on both the lateral scanning motion and in controlling the tip-sample interaction force are demonstrated to allow significantly faster, and more accurate AFM imaging.