Record link: 
http://hdl.handle.net/20.500.12708/27224
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Title: 
Improving the Imaging Speed of AFM with Modern Control Techniques
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Citation: 
Kuiper, S., & Schitter, G. (2011). Improving the Imaging Speed of AFM with Modern Control Techniques. In E. Eleftheriou & S. O. R. Moheimani (Eds.), Control Technologies for Emerging Micro and Nanoscale Systems (pp. 83–100). Springer-Verlag, Berlin-Heidelberg. https://doi.org/10.1007/978-3-642-22173-6_5
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Publisher DOI: 
10.1007/978-3-642-22173-6_5
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Publication Type: 
Book Contribution - Edited Volume Contribution
en
Authors: 
Kuiper, Stefan 
Schitter, Georg 
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Organisational Unit: 
E376-01 - Forschungsbereich Intelligente Mechatronische Systeme 
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Published in: 
Control Technologies for Emerging Micro and Nanoscale Systems 
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ISBN: 
978-3-642-22173-6
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DOI of the book: 
10.1007/978-3-642-22173-6
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Date (published): 
2011
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Number of Pages: 
18
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Publisher: 
Springer-Verlag, Berlin / Heidelberg
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Abstract: 
In Atomic Force Microscopy (AFM), the dynamics and non-linearities of the positioning stage are major sources of image artifacts and distortion, especially when imaging at high-speed. This contribution discusses some recent development to compensate for these adverse effects of the positioning stage dynamics in high-speed AFM by utilizing modern control methods. The improvements on both the lateral scanning motion and in controlling the tip-sample interaction force are demonstrated to allow significantly faster, and more accurate AFM imaging.
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Book Contribution

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