<div class="csl-bib-body">
<div class="csl-entry">Maier, J., & Steininger, A. (2014). Online Test Vector Insertion: A Concurrent Built-In Self-Testing (CBIST) Approach for Asynchronous Logic. In <i>17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems</i> (pp. 33–38). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/DDECS.2014.6868759</div>
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The final publication is available via <a href="https://doi.org/10.1109/DDECS.2014.6868759" target="_blank">https://doi.org/10.1109/DDECS.2014.6868759</a>.
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dc.description.abstract
Complementing concurrent checking with online testing is crucial for preventing fault accumulation in fault-tolerant systems with long mission times. While implementing a non-intrusive online test is cumbersome in a synchronous environment, this task becomes even more challenging in asynchronous designs. The latter receive increasing attention, mainly due to their elastic timing behaviour; however the issues related with their testing remain a key obstacle for their wide adoption. In this paper we present a novel approach for testing of asynchronous circuits that leverages the redundancy present in the conventional 4-phase protocol for implementing a fully transparent and fully concurrent test procedure. The key idea is to use the protocol's unproductive NULL phase for processing test vectors, thus effectively interleaving the incoming 4-phase data stream with a test data stream in a 2-phase fashion. We present implementation templates for the fundamental building blocks required and give a proof-of-concept by an example application that also serves as a platform for evaluating the overheads of our solution which turn out to be moderate.
en
dc.language
English
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dc.language.iso
en
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dc.publisher
Institute of Electrical and Electronics Engineers (IEEE)
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dc.relation.ispartofseries
IEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS)
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dc.rights.uri
http://rightsstatements.org/vocab/InC/1.0/
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dc.subject
Asynchronous Logic
en
dc.title
Online Test Vector Insertion: A Concurrent Built-In Self-Testing (CBIST) Approach for Asynchronous Logic
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.rights.license
In Copyright
en
dc.rights.license
Urheberrechtsschutz
de
dc.relation.isbn
9781479945580
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dc.relation.doi
10.1109/DDECS32181.2014
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dc.description.startpage
33
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dc.description.endpage
38
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dc.rights.holder
2014 IEEE.
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
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tuw.book.ispartofseries
IEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS)
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tuw.relation.publisher
IEEE
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tuw.version
am
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tuw.publication.orgunit
E191-02 - Forschungsbereich Embedded Computing Systems
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tuw.publisher.doi
10.1109/DDECS.2014.6868759
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dc.identifier.libraryid
AC15661832
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dc.description.numberOfPages
6
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dc.identifier.urn
urn:nbn:at:at-ubtuw:3-9942
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tuw.author.orcid
0000-0002-0965-5746
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tuw.author.orcid
0000-0002-3847-1647
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dc.rights.identifier
In Copyright
en
dc.rights.identifier
Urheberrechtsschutz
de
tuw.event.name
17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
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tuw.event.startdate
23-04-2014
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tuw.event.enddate
25-04-2014
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tuw.event.online
On Site
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tuw.event.type
Event for scientific audience
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tuw.event.place
Warschau
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tuw.event.country
PL
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tuw.event.presenter
Maier, Jürgen
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item.fulltext
with Fulltext
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item.grantfulltext
open
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.cerifentitytype
Publications
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item.languageiso639-1
en
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item.openairetype
conference paper
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item.openaccessfulltext
Open Access
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item.mimetype
application/pdf
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crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems
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crisitem.author.dept
E191-02 - Forschungsbereich Embedded Computing Systems