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Record link: 
http://hdl.handle.net/20.500.12708/65714
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Title: 
Nanotechnologiy and Nanometrology Outlook with Consideration of Standardization
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Citation: 
Afjehi-Sadat, A. (2007). Nanotechnologiy and Nanometrology Outlook with Consideration of Standardization. In Proceedings of the 8th International Conference - Modern Technologies in Manufacturing (pp. 7–10). http://hdl.handle.net/20.500.12708/65714
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Afjehi-Sadat, Ali 
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Organisational Unit: 
E311-01-4 - Forschungsgruppe Fertigungsmesstechnik und adaptronische Systeme 
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Published in: 
Proceedings of the 8th International Conference - Modern Technologies in Manufacturing 
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Date (published): 
2007
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Event name: 
8th International Conference - Modern Technologies in Manufacturing - MTeM2007 
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Event date: 
4-Oct-2007 - 5-Oct-2007
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Event place: 
Cluj-Napoca, EU
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Number of Pages: 
4
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Peer reviewed: 
No
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Science Branch: 
Maschinenbau, Instrumentenbau
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Appears in Collections:
Conference Paper

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