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Record link: 
http://hdl.handle.net/20.500.12708/77934
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Title: 
Exploiting the Acceleration Voltage Dependence of EMCD
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Citation: 
Löffler, S., Stöger-Pollach, M., Steiger-Thirsfeld, A., & Hetaba, W. (2018). Exploiting the Acceleration Voltage Dependence of EMCD. In 19th International Microscopy Congress (p. 1). http://hdl.handle.net/20.500.12708/77934
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Löffler, Stefan 
Stöger-Pollach, Michael 
Steiger-Thirsfeld, Andreas 
Hetaba, Walid 
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Organisational Unit: 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
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Published in: 
19th International Microscopy Congress 
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Date (published): 
2018
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Event name: 
19th International Microscopy Congress 
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Event date: 
9-Sep-2018 - 14-Sep-2018
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Event place: 
Sydney, Australien, Non-EU
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Number of Pages: 
1
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Peer reviewed: 
No
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Research Areas: 
Special and Engineering Materials: 50%
Materials Characterization: 50%
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Science Branch: 
Physik, Astronomie
Chemie
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Appears in Collections:
Conference Paper

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