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Record link: 
http://hdl.handle.net/20.500.12708/88360
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Title: 
Ballistic Electron Transport in Spin Valve Transistors Studied by Scanning Tunneling Microscopy Techniques
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Citation: 
Heer, R., Smoliner, J., Bornemeier, J., & Brückl, E. (2005). Ballistic Electron Transport in Spin Valve Transistors Studied by Scanning Tunneling Microscopy Techniques. 47th Annual TMS Electronic Materials Conference, Santa Barbara, California, Austria. http://hdl.handle.net/20.500.12708/88360
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Publication Type: 
Presentation - Conference presentation
en
Authors: 
Heer, Rudolf 
Smoliner, Jürgen 
Bornemeier, J. 
Brückl, Ewald 
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Organisational Unit: 
E362 - Institut für Festkörperelektronik 
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Date (published): 
2005
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Event name: 
47th Annual TMS Electronic Materials Conference 
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Event date: 
22-Jun-2005 - 24-Jun-2005
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Event place: 
Santa Barbara, California, Austria
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Presentation

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