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Record link: 
http://hdl.handle.net/20.500.12708/90165
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Title: 
Low momentum and high aspect ratio MFM probes fabricated by EBID
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Citation: 
Gavagnin, M., Wanzenböck, H. D., Shawrav, M. M., Stöger-Pollach, M., & Steiger-Thirsfeld, A. (2013). Low momentum and high aspect ratio MFM probes fabricated by EBID. International Conference Micro- and Nanoelectronics (ICMNE), Moscow-Zvenigorod, Non-EU. http://hdl.handle.net/20.500.12708/90165
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Publication Type: 
Presentation - Poster presentation
en
Authors: 
Gavagnin, Marco 
Wanzenböck, Heinz D. 
Shawrav, Mostafa Moonir 
Stöger-Pollach, Michael 
Steiger-Thirsfeld, Andreas 
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Organisational Unit: 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
E362 - Institut für Festkörperelektronik 
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Date (published): 
2013
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Event name: 
International Conference Micro- and Nanoelectronics (ICMNE) 
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Event date: 
1-Oct-2007 - 5-Oct-2007
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Event place: 
Moscow-Zvenigorod, Non-EU
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Presentation

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