IEEE International Integrated Reliability Workshop (IIRW 2020)

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Description

Event name
IEEE International Integrated Reliability Workshop (IIRW 2020)
 
Event type
Event for scientific audience
 
Start date
04-10-2020
End date
08-10-2020
 
Location
South Lake Tahoe
Country
United States
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-2 of 2 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Tselios, K. ; Stampfer, B. ; Michl, J. ; Ioannidis, E. ; Enichlmair, H. ; Waltl, M. Distribution of Step Heights of Electron and Hole Traps in SiON nMOS TransistorsKonferenzbeitrag Inproceedings 2020
2Vasilev, Alexander ; Jech, Markus ; Grill, Alexander ; Rzepa, Gerhard ; Schleich, Christian ; Makarov, Alexander ; Pobegen, Gregor ; Grasser, Tibor ; Waltl, Michael ; Tyaginov, Stanislav Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC TransistorsKonferenzbeitrag Inproceedings 2020