IEEE Electron Device Letters

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Journal description

Title Titel
IEEE Electron Device Letters
 
e-ISSN
1558-0563
 
ISSN
0741-3106
 
Publisher Herausgeber
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
 
Publisher's Address Herausgeber Adresse
445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Author:  Franco, Jacopo

Results 1-3 of 3 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Kaczer, Ben ; Franco, Jacopo ; Roussel, Philippe J. ; Groeseneken, Guido ; Chiarella, Thomas ; Horiguchi, Naoto ; Grasser, Tibor Extraction of The Random Component of Time-Dependent Variability Using Matched PairsArtikel Article2015
2Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Makarov, Alexander ; Vexler, Mikhail I. ; Kaczer, Ben ; Grasser, Tibor Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion ApproachArtikel Article 2017
3Tyaginov, Stanislav ; Jech, Markus ; Franco, Jacopo ; Sharma, Prateek ; Kaczer, Ben ; Grasser, Tibor Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON n-MOSFETsArtikel Article 2016