IEEE Transactions on Electron Devices

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Journal description

Title Titel
IEEE Transactions on Electron Devices
 
e-ISSN
1557-9646
 
ISSN
0018-9383
 
Publisher Herausgeber
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
 
Publisher's Address Herausgeber Adresse
445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Date Issued:  [2000 TO 2024]
Subject:  Electronic, Optical and Magnetic Materials

Results 61-72 of 72 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
61Franco, Jacopo ; Kaczer, Ben ; Toledano-Luque, María ; Roussel, Philippe J. ; Kauerauf, Thomas ; Mitard, Jérôme ; Witters, Liesbeth ; Grasser, Tibor ; Groeseneken, Guido SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices-Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability IssuesArtikel Article2013
62Franco, Jacopo ; Kaczer, Ben ; Roussel, Philippe J. ; Mitard, Jérôme ; Cho, Moonju ; Witters, Liesbeth ; Grasser, Tibor ; Groeseneken, Guido SiGe Channel Technology: Superior Reliability Toward Ultrathin EOT Devices-Part I: NBTIArtikel Article2013
63Toifl, Alexander ; Simonka, Vito ; Hössinger, Andreas ; Selberherr, Siegfried ; Grasser, Tibor ; Weinbub, Josef Simulation of the Effects of Postimplantation Annealing on Silicon Carbide DMOSFET CharacteristicsArtikel Article Jul-2019
64Mahmoudi, Hiwa ; Hofbauer, Michael ; Steindl, Bernhard ; Schneider-Hornstein, Kerstin ; Zimmermann, Horst Statistical Study of Intrinsic Parasitics in an SPAD-Based Integrated Fiber Optical ReceiverArtikel Article 2019
65Hosseini, Manouchehr ; Elahi, Mohammad ; Pourfath, Mahdi ; Esseni, David Strain-Induced Modulation of Electron Mobility in Single-Layer Transition Metal Dichalcogenides MX₂ ( M = Mo, W ; X = S , Se)Artikel Article 2015
66Sharma, Shashikant ; Bayer, B. C. ; Skakalova, Viera ; Singh, Ghanshyam ; Periasamy, Chinnamuthan Structural, Electrical and UV Detection Properties of ZnO/Si Heterojunction DiodesArtikel Article 2016
67Waltl, M. ; Rzepa, G. ; Grill, A. ; Goes, W. ; Franco, J. ; Kaczer, B. ; Witters, L. ; Mitard, J. ; Horiguchi, N. ; Grasser, T. Superior NBTI in High-k SiGe Transistors - Part I: ExperimentalArtikel Article 2017
68Waltl, M. ; Rzepa, G. ; Grill, A. ; Goes, W. ; Franco, J. ; Kaczer, B. ; Witters, L. ; Mitard, J. ; Horiguchi, N. ; Grasser, T. Superior NBTI in High-k SiGe Transistors - Part II: TheoryArtikel Article 2017
69Ungersboeck, E. ; Dhar, S. ; Karlowatz, G. ; Sverdlov, V. ; Kosina, H. ; Selberherr, S. The Effect of General Strain on the Band Structure and Electron Mobility of SiliconArtikel Article2007
70Waldhoer, Dominic ; Schleich, Christian ; Michl, Jakob ; Stampfer, Bernhard ; Tselios, Konstantinos ; Ioannidis, Eleftherios G. ; Enichlmair, Hubert ; Waltl, Michael ; Grasser, Tibor Toward Automated Defect Extraction From Bias Temperature Instability MeasurementsArtikel Article 2021
71Khaliji, Kaveh ; Noei, Maziar ; Tabatabaei, Seyed Mohammad ; Pourfath, Mahdi ; Fathipour, Morteza ; Abdi, Yaser Tunable Bandgap in Bilayer Armchair Graphene Nanoribbons: Concurrent Influence of Electric Field and Uniaxial StrainArtikel Article2013
72Puschkarsky, Katja ; Reisinger, Hans ; Schlünder, Christian ; Gustin, Wolfgang ; Grasser, Tibor Voltage-Dependent Activation Energy Maps for Analytic Lifetime Modeling of NBTI Without Time ExtrapolationArtikel Article 2018