JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

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Journal description

Title Titel
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
 
e-ISSN
2166-2754
 
ISSN
2166-2746
 
Publisher Herausgeber
A V S AMER INST PHYSICS
 
Publisher's Address Herausgeber Adresse
STE 1 NO 1, 2 HUNTINGTON QUADRANGLE, MELVILLE, USA, NY, 11747-4502
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Date Issued:  [2000 TO 2023]
Subject:  Electronic, Optical and Magnetic Materials
Subject:  Materials Chemistry
Author:  Grasser, Tibor

Results 1-5 of 5 (Search time: 0.005 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Starkov, I. ; Tyaginov, S. ; Enichlmair, H. ; Cervenka, J. ; Jungemann, C. ; Carniello, S. ; Park, J. M. ; Ceric, H. ; Grasser, T. Hot-Carrier Degradation Caused Interface State Profile-Simulation versus ExperimentArtikel Article2011
2Kaczer, B. ; Franco, J. ; Tyaginov, S. ; Jech, M. ; Rzepa, G. ; Grasser, T. ; O'Sullivan, B. J. ; Ritzenhaler, R. ; Schram, T. ; Spessot, A. ; Linten, D. ; Horiguchi, N. Mapping of CMOS FET Degradation in Bias Space--Application to Dram Peripheral DevicesArtikel Article 2017
3Schanovsky, F. ; Gös, W. ; Grasser, T. Multiphonon Hole Trapping from First PrinciplesArtikel Article2011
4Toledano-Luque, M. ; Kaczer, B. ; Roussel, Ph. ; Cho, M. J. ; Grasser, T. ; Groeseneken, G. Temperature Dependence of the Emission and Capture Times of SiON Individual Traps after Positive Bias Temperature StressArtikel Article2011
5Toledano-Luque, María ; Kaczer, Ben ; Grasser, Tibor ; Roussel, Philippe J. ; Franco, Jacopo ; Groeseneken, Guido Toward a Streamlined Projection of Small Device Bias Temperature Instability Lifetime DistributionsArtikel Article2013