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| | Preview | Author(s) | Title | Type | Issue Date |
| 21 | | Starkov, Ivan ; Enichlmair, Hubert | Local Oxide Capacitance as a Crucial Parameter for Characterization of Hot-Carrier Degradation in Long-Channel n-MOSFETs | Artikel Article | 2013 |
| 22 | | Roediger, Peter ; Mijic, Mario ; Zeiner, Clemens ; Lugstein, Alois ; Wanzenboeck, Heinz D. ; Bertagnolli, Emmerich | Local, direct-write, damage-free thinning of germanium nanowires | Artikel Article  | 2011 |
| 23 | | Golka, Sebastian ; Schartner, Stefan ; Schrenk, Werner ; Strasser, Gottfried | Low bias reactive ion etching of GaAs with a SiCl₄/N₂/O₂ time-multiplexed process | Artikel Article | 2007 |
| 24 | | Kaczer, B. ; Franco, J. ; Tyaginov, S. ; Jech, M. ; Rzepa, G. ; Grasser, T. ; O'Sullivan, B. J. ; Ritzenhaler, R. ; Schram, T. ; Spessot, A. ; Linten, D. ; Horiguchi, N. | Mapping of CMOS FET Degradation in Bias Space--Application to Dram Peripheral Devices | Artikel Article | 2017 |
| 25 | | Ebm, Christoph ; Hobler, Gerhard ; Waid, Simon ; Wanzenboeck, Heinz D. | Modeling of precursor coverage in ion-beam induced etching and verification with experiments using XeF2 on SiO2 | Artikel Article | 2010 |
| 26 | | Schanovsky, F. ; Gös, W. ; Grasser, T. | Multiphonon Hole Trapping from First Principles | Artikel Article | 2011 |
| 27 | | Wanzenböck, Heinz D. ; Waid, Simon ; Bertagnolli, Emmerich ; Mühlberger, Michael ; Bergmair, Iris ; Schöftner, Rainer | Nanoimprint lithography stamp modification utilizing focused ion beams | Artikel Article | 2009 |
| 28 | | Ebm, Christoph ; Hobler, Gerhard ; Waid, Simon ; Wanzenboeck, Heinz D. | Quantitative simulation of ion-beam induced deposition of nanostructures | Artikel Article | 2011 |
| 29 | | Kaczer, Ben ; Grasser, Tibor ; Franco, J. ; Toledano-Luque, M. ; Roussel, Ph. J. ; Cho, M. ; Simoen, E. ; Groeseneken, G. | Recent Trends in Bias Temperature Instability | Artikel Article | 2011 |
| 30 | | Powell, Cedric J. ; Tougaard, Sven ; Werner, Wolfgang S. M. ; Smekal, Werner | Sample-morphology effects on x-ray photoelectron peak intensities | Artikel Article | 2013 |
| 31 | | Makarov, A. ; Sverdlov, V. ; Selberherr, S. | Stochastic Model of the Resistive Switching Mechanism in Bipolar Resistive Random Access Memory: Monte Carlo Simulations | Artikel Article | 2011 |
| 32 | | Toledano-Luque, M. ; Kaczer, B. ; Roussel, Ph. ; Cho, M. J. ; Grasser, T. ; Groeseneken, G. | Temperature Dependence of the Emission and Capture Times of SiON Individual Traps after Positive Bias Temperature Stress | Artikel Article | 2011 |
| 33 | | Dedyk, Antonina ; Pavlova, Yulia ; Karmanenko, Sergey ; Semenov, Alexander ; Semikin, Dmitry ; Pakhomov, Oleg ; Starkov, Alexander ; Starkov, Ivan | Temperature Hysteresis of the Capacitance Dependence C(T) for Ferroelectric Ceramics | Artikel Article | 2011 |
| 34 | | Toledano-Luque, María ; Kaczer, Ben ; Grasser, Tibor ; Roussel, Philippe J. ; Franco, Jacopo ; Groeseneken, Guido | Toward a Streamlined Projection of Small Device Bias Temperature Instability Lifetime Distributions | Artikel Article | 2013 |
