Forschungsbereich Intelligente Mechatronische Systeme

Organization Name (de) Name der Organisation (de)
E376-01 - Forschungsbereich Intelligente Mechatronische Systeme
 
Code Kennzahl
E376-01
 
Type of Organization Organisationstyp
Research Division
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 


Results 41-60 of 473 (Search time: 0.017 seconds).

PreviewAuthor(s)TitleTypeIssue Date
41Nalbach, Mathis ; Motoi, Naoki ; Rufin, Manuel ; Andriotis, Orestis ; Schitter, Georg ; Thurner, Philipp Creep behavior of individual collagen fibrils in tension is dependenton cross-linkingPresentation Vortrag26-Jun-2022
42Motoi-2022-IEEE Open Journal of the Industrial Electronics Society-vor.pdf.jpgMotoi, Naoki ; Nalbach, Mathis ; Ito, Shingo ; Thurner, Philipp ; Schitter, Georg Force-Controlled Tensile Test of Collagen Fibril by Using 2-DOF Control System With Modeling Error CompensationArticle Artikel 2-Jun-2022
43Csencsics, Ernst ; Wolf, Tobias ; Schitter, Georg Efficient framework for the simulation of translational and rotational laser speckle displacement in optical sensor assembliesArticle Artikel 25-Feb-2022
44Wertjanz, Daniel ; Csencsics, Ernst ; Kern, Thomas ; Schitter, Georg Bringing the lab to the fab: Robot-based inline measurement system for precise 3D surface inspection in vibrational environmentsArtikel Article 2022
45Ojdanić, Denis ; Gräf, Benjamin ; Sinn, Andreas ; Yoo, Han Woong ; Schitter, Georg Camera-guided real-time laser ranging for multi-UAV distance measurementArticle Artikel 2022
46Schlarp, Johannes ; Klemen, Lukas ; Csencsics, Ernst ; Schitter, Georg Improving the Repeatability of a Color Sensor by Integrating an FSM for Scanning-based Areal MeasurementsInproceedings Konferenzbeitrag 2022
47Schwaer, Christian ; Stefanek, David ; Sinn, Andreas ; Schitter, Georg Integrated Force Sensor based on Optical Distance Measurement for a Modular Actuator used in Active OpticsInproceedings Konferenzbeitrag2022
48Wertjanz, Daniel ; Kern, Thomas ; Pechhacker, Alexander ; Csencsics, Ernst ; Schitter, Georg Robotic precision 3D measurements in vibration-prone environments enabled by active six DoF sample-trackingInproceedings Konferenzbeitrag 2022
49Csencsics, Ernst ; Schlarp, Johannes ; Glaser, Tobias ; Wolf, Tobias ; Schitter, Georg Simulation and Reduction of Speckle-induced Uncertainty in Laser Triangulation SensorsInproceedings Konferenzbeitrag 2022
50Wertjanz, Daniel ; Berlakovich, Nikolaus ; Csencsics, Ernst ; Schitter, Georg Range extension of a scanning confocal chromatic sensor for precise robotic inline 3D measurementsInproceedings Konferenzbeitrag 2022
51Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement ModesInproceedings Konferenzbeitrag 2022
52Schlarp, Johannes ; Csencsics, Ernst ; Schitter, Georg Analyzing error sources and error propagation in an optical scanning 3D triangulation sensor systemInproceedings Konferenzbeitrag2022
53Fürst, Martin Ephraim ; Berlakovich, Nikolaus ; Csencsics, Ernst ; Schitter, Georg Scanning Shack-Hartmann sensor for wavefront measurements on freeform opticsInproceedings Konferenzbeitrag 2022
54Cong, Bo ; Schlarp, Johannes ; Schitter, Georg Iterative Learning Control for the Active Error Correction of Polygon Mirror Based Laser ScanningInproceedings Konferenzbeitrag 2022
55Binder, Stefan ; Zandrini, Tommaso ; Yoo, Han Woong ; Schitter, Georg ; Ovsianikov, Aleksandr Development and characterization of a resonant scanner based 2-photon polymerization printerInproceedings Konferenzbeitrag2022
56Sinn, Andreas ; Prager, Patrik ; Schwaer, Christian ; Schitter, Georg Design and Evaluation of an Active Secondary Mirror Positioning System for a Small TelescopeArtikel Article 2022
57Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Influence of Imaging Parameters on AFM Surface Potential Measurements in Aqueous SolutionsInproceedings Konferenzbeitrag 2022
58Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg Mechatronic Demodulation of Self-Sensing Cantilever for DC-bias free AFM Imaging in LiquidInproceedings Konferenzbeitrag 2022
59Hackl-2022-ACS Nano-vor.pdf.jpgHackl, Thomas ; Schitter, Georg ; Mesquida, Patrick AC Kelvin Probe Force Microscopy Enables Charge Mapping in WaterArticle Artikel 2022
60Yoo, Han Woong ; Brunner, David ; Macho, Matthias ; Niedermueller, Leonhard ; Devesa, Angel Jurado ; Kormann, Leonhard ; Schitter, Georg Evaluation of robustness against external vibrations for long-range MEMS lidar with one-dimensional resonant micromirrorArtikel Article 2022