Forschungsbereich Intelligente Mechatronische Systeme

Organization Name (de) Name der Organisation (de)
E376-01 - Forschungsbereich Intelligente Mechatronische Systeme
 
Code Kennzahl
E376-01
 
Type of Organization Organisationstyp
Research Division
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 


Results 281-300 of 473 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
281Novak, Petr ; Melik-Merkumians, Martin ; Steinegger, Michael ; Moser, Thomas ; Sindelar, Radek ; Zoitl, Alois Extraction of Automation System Engineering Knowledge for Mapping Plant and Simulation InterfacesBuchbeitrag Book Contribution2013
282Nahar, Sayeda ; Schmets, Alexander ; Scarpas, Athanasios ; Schitter, Georg Temperature induced healing in strained bituminous materials observed by atomic force microscopyKonferenzbeitrag Inproceedings2013
283Nahar, Sayeda ; Dillingh, Bert ; Erkens, Sandra ; Schmets, Alexander ; Fischer, Hartmut R. ; Scarpas, Athanasios ; Schitter, Georg Is Atomic Force Microscopy suited as tool for fast screening of bituminous materials? An inter-laboratory comparison studyKonferenzbeitrag Inproceedings 2013
284Steininger, Jürgen ; Ito, Shingo ; Schitter, Georg Modellbasierte Regelung eines dual aktuierten Nano-PositioniersystemsPräsentation Presentation2013
285Schitter, Georg Precision Engineering for Mechatronic Imaging SystemsPräsentation Presentation2013
286Schitter, Georg Mechatronics and Instrumentation for High-Speed High-Resolution Imaging SystemsPräsentation Presentation2013
287Schitter, Georg Präzisionstechnologie: Positionieren, Abbilden und Messen in der HochtechnologiePräsentation Presentation2013
288Schitter, Georg Precision Engineering for Mechatronic Imaging SystemsPräsentation Presentation2013
289Kuiper, S. ; Van den Hof, P.M.J. ; Schitter, G. Integrated designof the feedback controller and topography estimator for atomic force microscopyArtikel Article2013
290Rodler, M. ; Melik-Merkumians, Martin ; Lepuschitz, W. ; Merdan, M. Visualization of an agent-based batch process systemKonferenzbeitrag Inproceedings 2013
291Chang, Peter I. ; Chavan, Dhwajal ; Paris, René ; Iannuzzi, Davide ; Schitter, Georg Towards High Speed Ferrule-Top Atomic Force MicroscopyKonferenzbeitrag Inproceedings 2013
292van Loon, Annelies ; Keune, Katrien ; Dik, Joris ; Kohl, Dominik ; Chang, Peter I. ; Schitter, Georg Analytical Spectroscopy in Art and ArchaeologyKonferenzbeitrag Inproceedings2013
293Ito, Shingo ; Steininger, Jürgen ; Chang, Peter I. ; Schitter, Georg High-precision Positioning System using a Low-stiffness Dual Stage ActuatorKonferenzbeitrag Inproceedings 2013
294Prostejovsky, Alexander ; Merdan, Munir ; Schitter, Georg ; Dimeas, Aris Demonstration of a Multi-Agent-Based Control System for Active Electric Power Distribution GridsKonferenzbeitrag Inproceedings 2013
295Ito, Shingo ; Steininger, Jürgen ; Schitter, Georg Influence of fine actuator stiffness in dual stage actuation on vibration isolation propertiesKonferenzbeitrag Inproceedings2013
296Paris, René ; Thurner, Thomas ; Schitter, Georg Compensation Based Displacement Measurement Using Objective Laser SpecklesKonferenzbeitrag Inproceedings2013
297Janschek, Klaus ; Sandner, Thilo ; Schroedter, Richard ; Roth, Matthias Adaptive Prefilter Design for Control of Quasistatic MicroscannersKonferenzbeitrag Inproceedings2013
298Oldenbeuving, Ruud M. ; Song, Hong ; Schitter, Georg ; Verhaegen, Michel ; Klein, Edwin Jan ; Lee, Chris J. ; Offerhaus, Herman L. ; Boller, Klaus-J. High precision wavelength estimation method for integrated opticsArtikel Article2013
299Nahar, S.N. ; Schmets, A.J.M. ; Scarpas, A. ; Schitter, G. Temperature and thermal history dependence of the microstructure in bituminous materialsArtikel Article2013
300Thier, Markus ; Paris, Rene ; Thurner, Thomas ; Schitter, Georg Low-Latency Shack Hartmann Wavefront Sensor Based on an Industrial Smart CameraArtikel Article2013