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Author:  Stabentheiner, Manuel

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1Wieland, D. ; Ofner, S. ; Stabentheiner, Manuel ; Butej, Boris ; Koller, C. ; Sun, J. ; Minetto, A ; Reiser, K. ; Häberlen, O. ; Nelhiebel, M. ; Glavanovics, M ; Pogany, D. ; Ostermaier, C A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit testsInproceedings Konferenzbeitrag 2023

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Author:  Stabentheiner, Manuel

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1Stabentheiner Manuel - 2024 - Electrical impact of dislocations in lateral and...pdf.jpgStabentheiner, Manuel Electrical impact of dislocations in lateral and quasi-vertical GaN-on-Si diodesThesis Hochschulschrift 2024
2Stabentheiner, Manuel Investigation of the gate leakage current degradation in p-GaN devicesThesis Hochschulschrift2018