Grasser, Tibor

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Grasser, Tibor
 
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Contributing Publications Mitbeteiligte Publikationen

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Subject:  Bauelementzuverlässigkeit

Results 1-4 of 4 (Search time: 0.008 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Ruch Bernhard - 2021 - Hot-carrier degradation in planar and trench Si-MOSFETs.pdf.jpgRuch, Bernhard Hot-carrier degradation in planar and trench Si-MOSFETsThesis Hochschulschrift 2021
2Stampfer Bernhard - 2020 - Advanced electrical characterization of charge...pdf.jpgStampfer, Bernhard Advanced electrical characterization of charge trapping in MOS transistorsThesis Hochschulschrift 2020
3Jech Markus - 2020 - The physics of non-equilibrium reliability phenomena.pdf.jpgJech, Markus The physics of non-equilibrium reliability phenomenaThesis Hochschulschrift 2020
4Sharma Prateek - 2020 - Predictive and efficient modeling of hot carrier...pdf.jpgSharma, Prateek Predictive and efficient modeling of hot carrier degradation with drift-diffusion based carrier transport modelsThesis Hochschulschrift 2020