Grasser, Tibor

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Grasser, Tibor
 
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Own Publications Eigene Publikationen

Results 1-2 of 2 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Grasser, Tibor Simulation of miniaturized semiconductor devicesThesis Hochschulschrift2002
2Grasser Tibor - 1999 - Mixed-mode device simulation.pdf.jpgGrasser, Tibor Mixed-mode device simulationThesis Hochschulschrift 1999

Contributing Publications Mitbeteiligte Publikationen

Results 1-20 of 43 (Search time: 0.031 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Fehringer Franz - 2024 - Machine Learning Force Field for Dynamic Oxidation of...pdf.jpgFehringer, Franz Machine learning force field for dynamic oxidation of siliconThesis Hochschulschrift 2024
2Feil Maximilian Wolfgang - 2024 - Radiative and Non-Radiative Phenomena During...pdf.jpgFeil, Maximilian Wolfgang Radiative and non-radiative phenomena during gate-switching in silicon carbide power MOSFETsThesis Hochschulschrift 2024
3Cvitkovich Lukas - 2024 - Atomistic Modeling of Si Spin Qubits From First...pdf.jpgCvitkovich, Lukas Atomistic modeling of Si spin qubits from first principlesThesis Hochschulschrift 2024
4Milardovich Diego - 2024 - Bridging Molecular Dynamics and Neuroscience Machine...pdf.jpgMilardovich, Diego Bridging molecular dynamics and neuroscience : Machine learning for efficient simulations and biomedical signal processingThesis Hochschulschrift 2024
5Wilhelmer Christoph - 2024 - Impact of Charge Transitions at Atomic Defect Sites...pdf.jpgWilhelmer, Christoph Impact of Charge Transitions at Atomic Defect Sites on Electronic Device PerformanceThesis Hochschulschrift 2024
6Waldhoer Dominic - 2024 - Multiscale Modeling of Defect-Related Reliability...pdf.jpgWaldhör, Dominic Multiscale Modeling of Defect-Related Reliability Phenomena in NanoelectronicsThesis Hochschulschrift 2024
7Schleich Christian - 2022 - Modeling of defect related reliability phenomena in...pdf.jpgSchleich, Christian Modeling of defect related reliability phenomena in SiC power-MOSFETsThesis Hochschulschrift 2022
8Knobloch Theresia - 2022 - On the electrical stability of 2D material-based...pdf.jpgKnobloch, Theresia On the electrical stability of 2D material-based field-effect transistorsThesis Hochschulschrift 2022
9Michl Jakob Daniel - 2022 - Charge trapping and variability in CMOS technologies...pdf.jpgMichl, Jakob Daniel Charge trapping and variability in CMOS technologies at cryogenic temperaturesThesis Hochschulschrift 2022
10Berens Judith Veronika - 2021 - Carrier mobility and reliability of 4H-SiC...pdf.jpgBerens, Judith Veronika Carrier mobility and reliability of 4H-SiC trench MOSFETsThesis Hochschulschrift 2021
11Ruch Bernhard - 2021 - Hot-carrier degradation in planar and trench Si-MOSFETs.pdf.jpgRuch, Bernhard Hot-carrier degradation in planar and trench Si-MOSFETsThesis Hochschulschrift 2021
12Weger Magdalena - 2021 - Electric characterization of SiC Trench MOSFETs with...pdf.jpgWeger, Magdalena Electric characterization of SiC Trench MOSFETs with DLTS and admittance spectroscopyThesis Hochschulschrift 2021
13Kratzmann Matthias - 2021 - Development of a low-noise CV measurement module for...pdf.jpgKratzmann, Matthias Development of a low-noise CV measurement module for defect-spectroscopy of MOS transistorsThesis Hochschulschrift 2021
14Jech Markus - 2020 - The physics of non-equilibrium reliability phenomena.pdf.jpgJech, Markus The physics of non-equilibrium reliability phenomenaThesis Hochschulschrift 2020
15Stampfer Bernhard - 2020 - Advanced electrical characterization of charge...pdf.jpgStampfer, Bernhard Advanced electrical characterization of charge trapping in MOS transistorsThesis Hochschulschrift 2020
16Sharma Prateek - 2020 - Predictive and efficient modeling of hot carrier...pdf.jpgSharma, Prateek Predictive and efficient modeling of hot carrier degradation with drift-diffusion based carrier transport modelsThesis Hochschulschrift 2020
17Waschneck Katja Anna - 2020 - Modeling Bias temperature instability in Si and...pdf.jpgWaschneck, Katja Anna Modeling Bias temperature instability in Si and SiC MOSFETs using activation energy mapsThesis Hochschulschrift 2020
18Schleich, Christian Charakterisierung und Modellierung von SiC TransistorenThesis Hochschulschrift2019
19Grill Alexander - 2018 - Charge trapping and single-defect extraction in...pdf.jpgGrill, Alexander Charge trapping and single-defect extraction in Gallium-Nitride based MIS-HEMTsThesis Hochschulschrift 2018
20Rescher Gerald - 2018 - Behavior of SiC-MOSFETs under temperature and voltage...pdf.jpgRescher, Gerald Behavior of SiC-MOSFETs under temperature and voltage stressThesis Hochschulschrift 2018