Full name Familienname, Vorname
Grasser, Tibor
 
Main Affiliation Organisations­zuordnung
 

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Subject:  Defekte

Results 1-3 of 3 (Search time: 0.01 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schleich Christian - 2022 - Modeling of defect related reliability phenomena in...pdf.jpgSchleich, Christian Modeling of defect related reliability phenomena in SiC power-MOSFETsThesis Hochschulschrift 2022
2Illarionov Yury - 2016 - Characterization and modeling of charged defects in...pdf.jpgIllarionov, Yury Characterization and modeling of charged defects in silicon and 2D field-effect transistorsThesis Hochschulschrift 2016
3Aichinger Thomas - 2010 - On the role of hydrogen in silicon device degradation...pdf.jpgAichinger, Thomas On the role of hydrogen in silicon device degradation and metalization processingThesis Hochschulschrift 2010