Stöger-Pollach, Michael

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Stöger-Pollach, Michael
 
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Subject:  EELS

Results 1-18 of 18 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Scales, Ze ; Reisinger, Michael ; Taylor, Aidan ; Nelhiebel, Michael ; Stöger-Pollach, Michael Physical Characterization of Dislocations in III-N Semiconductors including Quantification and ClassificationPresentation Vortrag24-Nov-2022
2Stöger-Pollach, Michael The choice of the right beam energy for analytical (scanning) transmission electron microscopyPresentation Vortrag6-Sep-2022
3Scales, Ze ; Reisinger, Michael ; Koller, Christian ; Taylor, Aidan ; Stöger-Pollach, Michael Physical Characterization of Crystal Defects in Gallium NitridePresentation Vortrag8-May-2022
4Stöger-Pollach, Michael ; Scales, Ze Low Energy Excitations at Low Beam EnergiesPresentation Vortrag6-Apr-2022
5Stoeger-Pollach-2022-The choice of the right beam energy for analytical s...-vor.pdf.jpgStöger-Pollach, Michael The choice of the right beam energy for analytical (scanning) transmission electron microscopyInproceedings Konferenzbeitrag 2022
6Löffler, Stefan ; Stöger-Pollach, Michael ; Steiger-Thirsfeld, Andreas ; Hetaba, Walid ; Schattschneider, Peter Exploiting the Acceleration Voltage Dependence of EMCDArtikel Article 2021
7Götsch, Thomas ; Stöger-Pollach, Michael ; Penner, Simon From zirconia to yttria: sampling the crystallographic and electronic phase diagram using sputter-deposited YSZ thin filmsKonferenzbeitrag Inproceedings2016
8Stöger-Pollach, Michael Quantifying transition radiation by employing CL and EELSKonferenzbeitrag Inproceedings2016
9Stöger-Pollach, Michael EELS. My Life in Science. - Opening CeremonyPräsentation Presentation2015
10Stöger-Pollach, Michael ; Löffler, Stefan ; Hetaba, Walid ; Schattschneider, Peter Investigating the optical properties of AlxGa1-xAs by low voltage VEELSKonferenzbeitrag Inproceedings2011
11Löffler, Stefan ; Ennen, Inga ; Stöger-Pollach, Michael ; Schattschneider, Peter Non-Lorentzian scattering behavior in core lossesKonferenzbeitrag Inproceedings2011
12Penner, Simon ; Lorenz, Harald ; Klötzer, Bernhard ; Stöger-Pollach, Michael ; Lebedev, Oleg ; Turner, Stuart Electron-microscopic characterization of pure oxide methanol steam reforming catalystsKonferenzbeitrag Inproceedings2009
13Stöger-Pollach, Michael ; Schattschneider, Peter ; Perkins, J. ; McComb, D. EMCD at high spatial resolution: comparison of STEM with EELS profilingKonferenzbeitrag Inproceedings2008
14Stöger-Pollach, Michael About the determination of optical properties using fast electronsKonferenzbeitrag Inproceedings2008
15Schwarz, Sabine ; Stöger-Pollach, Michael EELS and EFTEM-investigations of aluminum alloy 6016 concerning the elements Al, Si and MgKonferenzbeitrag Inproceedings2008
16Stöger-Pollach, M. ; Laister, A. ; Schattschneider, P. Treating retardation effects in valence EELS spectra for Kramers-Kronig analysisArtikel Article2008
17Stöger-Pollach, M. Optical properties and bandgaps from low loss EELS: Pitfalls and solutionsArtikel Article2008
18Stöger-Pollach, M. ; Schattschneider, P. The influence of relativistic energy losses on bandgap determination using valence EELSArtikel Article Nov-2007

Contributing Publications Mitbeteiligte Publikationen

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Subject:  EELS

Results 1-2 of 2 (Search time: 0.007 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wallisch Wolfgang - 2019 - Consequences of the CMR effect in EELS by using TEM.pdf.jpgWallisch, Wolfgang Consequences of the CMR effect in EELS by using TEMThesis Hochschulschrift 2019
2Laister, Anita Maria Removal of relativistic effects in the low loss region of electron energy loss spectraThesis Hochschulschrift2007