Waltl, Michael

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Waltl, Michael
 
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Subject:  Mechanical Engineering

Results 1-8 of 8 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Waltl, Michael ; Knobloch, Theresia ; Tselios, Konstantinos ; Filipovic, Lado ; Stampfer, Bernhard ; Hernandez, Yoanlys ; Waldhör, Dominic ; Illarionov, Yury ; Kaczer, Ben ; Grasser, Tibor Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?Artikel Article 2022
2Waltl, Michael ; Hernandez, Yoanlys ; Schleich, Christian ; Waschneck, Katja ; Stampfer, Bernhard ; Reisinger, Hans ; Grasser, Tibor Performance Analysis of 4H-SiC Pseudo-D CMOS Inverter Circuits Employing Physical Charge Trapping ModelsArtikel Article 2022
3Stampfer, Bernhard ; Schanovsky, Franz ; Grasser, Tibor ; Waltl, Michael Semi-Automated Extraction of the Distribution of Single Defects for nMOS TransistorsArtikel Article 23-Apr-2020
4Waltl, Michael Reliability of Miniaturized Transistors from the Perspective of Single-DefectsArtikel Article 2020
5Illarionov, Yury Yu ; Banshchikov, Alexander G ; Polyushkin, Dmitry K ; Wachter, Stefan ; Knobloch, Theresia ; Thesberg, Mischa ; Vexler, Mikhail I ; Waltl, Michael ; Lanza, Mario ; Sokolov, Nikolai S ; Mueller, Thomas ; Grasser, Tibor Reliability of Scalable MoS2 FETs With 2 nm Crystalline CaF2 InsulatorsArtikel Article 2019
6Illarionov, Yury Yu ; Knobloch, Theresia ; Waltl, Michael ; Rzepa, Gerhard ; Pospischil, Andreas ; Polyushkin, Dmitry ; Furchi, Marco Mercurio ; Mueller, Thomas ; Grasser, Tibor Energetic mapping of oxide traps in MoS₂ field-effect transistorsArtikel Article Jun-2017
7Illarionov, Yu. Yu. ; Waltl, M. ; Rzepa, G. ; Knobloch, T. ; Kim, J.-S. ; Akinwande, D. ; Grasser, T. Highly-Stable Black Phosphorus Field-Effect Transistors with Low Density of Oxide TrapsArtikel Article 2017
8Illarionov, Yury Yu ; Rzepa, Gerhard ; Waltl, Michael ; Knobloch, Theresia ; Grill, Alexander ; Furchi, Marco Mercurio ; Mueller, Thomas ; Grasser, Tibor The role of charge trapping in Mo₂/SiO₂ and MoS₂/hBN field-effect transistorsArtikel Article Sep-2016