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Full name Familienname, Vorname
Rott, Gunnar Andreas
 
Main Affiliation Organisations­zuordnung
 

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Results 1-12 of 12 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Jech, Markus ; Rott, Gunnar ; Reisinger, Hans ; Tyaginov, Stanislav ; Rzepa, Gerhard ; Grill, Alexander ; Jabs, Dominic ; Jungemann, Christoph ; Waltl, Michael ; Grasser, Tibor Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {VG, VD} Bias Space: Implications and PeculiaritiesArtikel Article 8-Aug-2020
2Puschkarsky, Katja ; Reisinger, H. ; Rott, Gunnar Andreas ; Schluender, C ; Gustin, W. ; Grasser, Tibor An Efficient Analog Compact NBTI Model for Stress and Recovery Based on Activation Energy MapsArtikel Article 2019
3Ullmann, Bianka ; Jech, Markus ; Puschkarsky, Katja ; Rott, Gunnar Andreas ; Waltl, Michael ; Illarionov, Yury ; Reisinger, Hans ; Grasser, Tibor Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part I: ExperimentalArtikel Article 2019
4Giering, K.-U. ; Puschkarsky, K. ; Reisinger, H. ; Rzepa, G. ; Rott, G. ; Vollertsen, R. ; Grasser, T. ; Jancke, R. NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level ModelingArtikel Article 2019
5Rott Gunnar Andreas - 2018 - Negative bias temperature instability and...pdf.jpgRott, Gunnar Andreas Negative bias temperature instability and hot-carrier degradation of 130 nm technology transistors including recovery effectsThesis Hochschulschrift 2018
6Giering, K.-U. ; Rott, G. ; Rzepa, G. ; Reisinger, H. ; Puppala, A.K. ; Reich, T. ; Gustin, W. ; Grasser, T. ; Jancke, R. Analog-circuit NBTI degradation and time-dependent NBTI variability: An efficient physics-based compact modelKonferenzbeitrag Inproceedings2016
7Rzepa, G. ; Goes, W. ; Rott, G. ; Rott, K. ; Karner, M. ; Kernstock, C. ; Kaczer, B. ; Reisinger, H. ; Grasser, T. Physical modeling of NBTI: From individual defects to devicesKonferenzbeitrag Inproceedings2014
8Rott, Gunnar Andreas ; Rott, K. ; Reisinger, H. ; Gustin, W. ; Grasser, Tibor Mixture of Negative Bias Temperature Instability and Hot-Carrier Driven Threshold Voltage Degradation of 130 nm Technology p-Channel TransistorsKonferenzbeitrag Inproceedings2014
9Rott, Gunnar Andreas ; Rott, Karina ; Reisinger, Hans ; Gustin, Wolfgang ; Grasser, Tibor Mixture of Negative Bias Temperature Instability and Hot-Carrier Driven Threshold Voltage Degradation of 130 nm Technology p-Channel TransistorsArtikel Article 2014
10Grasser, T. ; Rzepa, G. ; Waltl, M. ; Goes, W. ; Rott, K. ; Rott, G. ; Reisinger, H. ; Franco, J. ; Kaczer, B. Characterization and modeling of charge trapping: From single defects to devicesKonferenzbeitrag Inproceedings 2014
11Rott, Gunnar Andreas ; Nielen, H. ; Reisinger, H. ; Gustin, W. ; Tyaginov, S. E. ; Grasser, Tibor Drift Compensating Effect during Hot-Carrier Degradation of 130nm Dual Gate Oxide p-channel TransistorsKonferenzbeitrag Inproceedings2013
12Rott, K. ; Schmitt-Landsiedel, D. ; Reisinger, H. ; Rott, Gunnar Andreas ; Georgakos, G ; Schluender, C ; Aresu, S. ; Gustin, W. ; Grasser, Tibor Impact and measurement of short term threshold instabilities in MOSFETs of analog circuitsKonferenzbeitrag Inproceedings2012