Name Card

Full name Familienname, Vorname
Ruch, Bernhard
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-7 of 7 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Ruch Bernhard - 2021 - Hot-carrier degradation in planar and trench Si-MOSFETs.pdf.jpgRuch, Bernhard Hot-carrier degradation in planar and trench Si-MOSFETsThesis Hochschulschrift 2021
2Ruch, Bernhard ; Pobegen, Gregor ; Grasser, Tibor Localizing Hot-Carrier Degradation in Silicon Trench MOSFETsArtikel Article 2021
3Ruch, Bernhard ; Jech, Markus ; Pobegen, Gregor ; Grasser, Tibor Applicability of Shockley-Read-Hall Theory for Interface StatesArtikel Article 2021
4Ruch, Bernhard ; Pobegen, Gregor ; Grasser, Tibor Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge PumpingArtikel Article 2020
5Ruch, Bernhard ; Jech, Markus ; Pobegen, Gregor ; Grasser, Tibor Applicability of Shockley-Read-Hall Theory for Interface StatesKonferenzbeitrag Inproceedings 2020
6Ruch, Bernhard ; Pobegen, Gregor ; Schleich, Christian ; Grasser, Tibor Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge PumpingKonferenzbeitrag Inproceedings 2020
7Ruch, Bernhard Modelling of repetitive avalanche degradation in power trench MOSFETsThesis Hochschulschrift2016