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| | Preview | Authors / Editors | Title | Type | Issue Date |
| 1 | | Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Gavagnin, Marco ; Belic, Domagoj ; Rödinger, Peter ; Hochleitner, Gottfried ; Mika, Johann ; Taus, Philip ; Stöger-Pollach, Michael ; Bertagnolli, Emmerich | Focused electron beam induced processing (FEBIP) as maskless 3D direct-write nanolithography platform | Konferenzbeitrag Inproceedings | 2015 |
| 2 | | Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Nozzle-based injection systems for FEBID characteristics and limiations | Präsentation Presentation | 2015 |
| 3 | | Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Mika, Johann ; Shawrav, Mostafa Moonir ; Bertagnolli, Emmerich | Insights in precursor flux distribution on the sample surface - Is the nozzle setup really | Konferenzbeitrag Inproceedings | 2014 |
| 4 | | Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Waid, Simon ; Bertagnolli, Emmerich | Removal of FIB-Induced Amorphization and Gallium Contamination by Focused-Electron-Beam-Induced-Etching | Präsentation Presentation | 2011 |
| 5 | | Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Lugstein, Alois ; Bertagnolli, Emmerich | Local, Direct-Write, Damage-Free Thinning of Germanium Nanowires | Präsentation Presentation | 2011 |
| 6 | | Roediger, Peter ; Wanzenboeck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Crystallinity-retaining removal of germanium by direct-write focused electron beam induced etching | Artikel Article | 2011 |
| 7 | | Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Etching of Germanium by Chlorine Gas using a Focused Electron Beam | Präsentation Presentation | 2011 |
| 8 | | Wanzenböck, Heinz D. ; Rödiger, Peter ; Waid, Simon ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Focused Beam Induced Etching - Making the Right Choice Between Ions and Electrons | Präsentation Presentation | 2011 |
| 9 | | Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Electron beam induced etching of silicon using chlorine gas | Präsentation Presentation | 2010 |
| 10 | | Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Etching of Silicon by Chlorine Gas using a Focused Electron Beam | Präsentation Presentation | 2010 |
| 11 | | Hochleitner, Gottfried ; Hörtlackner, Michael ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich | Experimental evaluation of gas-flux distribution with gas injection systems for focused beam induced deposition | Konferenzbeitrag Inproceedings | 2010 |
| 12 | | Hochleitner, Gottfried ; Hörtlackner, Michael ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich | Thermally assisted focused electron beam induced deposition | Konferenzbeitrag Inproceedings | 2010 |
| 13 | | Hochleitner, Gottfried ; Lugstein, Alois ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich | Nanowire Synthesis on catalyst arrays produced with electron beam induced deposition | Konferenzbeitrag Inproceedings | 2010 |
| 14 | | Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | New Approach for Cleaning a SEM Chamber from Hydrocarbon Contamination | Präsentation Presentation | 2010 |
| 15 | | Hochleitner, Gottfried ; Steinmair, Mathias ; Lugstein, Alois ; Roediger, Peter ; Wanzenboeck, Heinz D ; Bertagnolli, Emmerich | Focused electron beam induced deposition of gold catalyst templates for Si-nanowire synthesis | Artikel Article | 2010 |
| 16 | | Burchhart, Thomas ; Lugstein, Alois ; Hyun, Youn Joo ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Atomic Scale Alignment of Copper-Germanide Contacts for Ge Nanowire Metal Oxide Field Effect Transistors | Artikel Article | 2009 |
| 17 | | Burchhart, Thomas ; Lugstein, Alois ; Hyun, Youn Joo ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Fabrication and Electrical Characterization of Ge Nanowires with Atomic Scale Aligned Copper-Germanide Contacts | Präsentation Presentation | 2009 |
| 18 | | Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Evaluation of chamber contamination in a scanning electron microscope | Artikel Article | 2009 |
| 19 | | Hochleitner, Gottfried ; Wanzenböck, Heinz D. ; Rödiger, Peter ; Bertagnolli, Emmerich ; Bühler, Wolfgang ; Rosenthal, A | Nanostructured Catalyst Arrays for Nanowire Synthesis | Konferenzbeitrag Inproceedings | 2008 |
| 20 | | Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich | Effect of gaseous additives on Electron Beam Induced Deposition | Präsentation Presentation | 2008 |
