Full name Familienname, Vorname
Mika, Johann Karl
 
Main Affiliation Organisations­zuordnung
 

Results 1-20 of 26 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wanzenböck, Heinz D. ; Schuller, Patrick ; Gergits, Martina ; Shawrav, Mostafa Moonir ; Mika, Johann ; Scholze, P ; Bertagnolli, Emmerich Controlling Neuronal Connectivity - A Microfluidic Microelelctrode Array for Evaluation of Neurotrophic FactorsPräsentation Presentation2016
2Shawrav, M.M. ; Gökdeniz, Z.G. ; Wanzenboeck, H.D. ; Taus, P. ; Mika, J.K. ; Waid, S. ; Bertagnolli, E. Chlorine based focused electron beam induced etching: A novel way to pattern germaniumArtikel Article 2016
3Mika, Johann Karl Universelle mikroelektronische Messplattform zur in vitro Untersuchung von Aktionspotentialen von sich regenerierenden Neuriten unter Einfluss des Neurotrophins "Nerve Growth Factor ß"Thesis Hochschulschrift2015
4Shawrav, Mostafa Moonir ; Mika, Johann ; Wanzenböck, Heinz D. ; Taus, Philip ; Gökdeniz, Z.G. ; Bertagnolli, Emmerich Combining in-situ etching and deposition-FEBIE modified germanium nanowire devices with electrical contacts by FEBID goldPräsentation Presentation2015
5Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Mika, Johann ; Waid, Simon ; Gökdeniz, Z.G. ; Rödiger, Peter ; Bertagnolli, Emmerich Focused Electron Beam Induced Etching - Advantages, Features & Limitations of FEBIE with ChlorineKonferenzbeitrag Inproceedings2015
6Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Mika, Johann ; Waid, Simon ; Gökdeniz, Z.G. ; Rödinger, Peter ; Bertagnolli, Emmerich Subtractive direct-writing with a focused electron beam - Tailoring monocrystalline semiconductors without carbon contamination by etchingKonferenzbeitrag Inproceedings2015
7Shawrav, Mostafa Moonir ; Mika, Johann ; Wanzenböck, Heinz D. ; Gökdeniz, Z.G. ; Waid, Simon ; Bertagnolli, Emmerich Chlorine based focused electron beam-induced surface patterning of semiconductor nanowiKonferenzbeitrag Inproceedings2015
8Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Gavagnin, Marco ; Belic, Domagoj ; Rödinger, Peter ; Hochleitner, Gottfried ; Mika, Johann ; Taus, Philip ; Stöger-Pollach, Michael ; Bertagnolli, Emmerich Focused electron beam induced processing (FEBIP) as maskless 3D direct-write nanolithography platformKonferenzbeitrag Inproceedings2015
9Schuller, Patrick ; Mika, Johann ; Wanzenböck, Heinz D. ; Scholze, Petra ; Bertagnolli, Emmerich Investigation of Neuronal Activity Recorded with Multi-Electrode Arrays Using Principal Component AnalysisKonferenzbeitrag Inproceedings2014
10Mika, Johann ; Schwarz, Karin ; Wanzenböck, Heinz D. ; Scholze, Petra ; Bertagnolli, Emmerich Simultaneous Electrical Investigation of Isolated Neurites Using a Neurite-Isolation Device as Neurite Regeneration ModelKonferenzbeitrag Inproceedings2014
11Wanzenböck, Heinz D. ; Exler, Andreas ; Mika, Johann ; Bertagnolli, Emmerich ; Engleder, Elisabeth ; Wirth, M ; Gabor, F Real-time Monitoring of Lesion Healing by Impedance Spectrometry on ChipKonferenzbeitrag Inproceedings2014
12Wanzenböck, Heinz D. ; Mika, Johann ; Shawrav, Mostafa Moonir ; Gavagnin, Marco ; Ismail, Bassem ; Zeiner, Clemens ; Lugstein, Alois ; Stöger-Pollach, Michael ; Bertagnolli, Emmerich Electron beam induced surface modification of semiconductor nanowires in a chlorine environment - A new route to electrical tailoring of nanodevicesKonferenzbeitrag Inproceedings2014
13Mika, Johann ; Shawrav, Mostafa Moonir ; Wanzenböck, Heinz D. ; Gavagnin, Marco ; Ismail, Bassem ; Zeiner, Clemens ; Lugstein, Alois ; Stöger-Pollach, Michael ; Bertagnolli, Emmerich Electrical tailoring of semiconductor nanodevices by Electron beam induced modification with chlorinePräsentation Presentation2014
14Wanzenboeck, H. D. ; Hochleitner, G. ; Mika, J. ; Shawrav, M. M. ; Gavagnin, M. ; Bertagnolli, E. Mapping of local argon impingement on a virtual surface: an insight for gas injection during FEBIDArtikel Article 2014
15Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Mika, Johann ; Shawrav, Mostafa Moonir ; Bertagnolli, Emmerich Insights in precursor flux distribution on the sample surface - Is the nozzle setup reallyKonferenzbeitrag Inproceedings2014
16Mika, Johann ; Wanzenböck, Heinz D. ; Scholze, P ; Bertagnolli, Emmerich Optical microscopy of artificially isolated axons on microelectronic measurement platformKonferenzbeitrag Inproceedings2013
17Mika, Johann ; Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Gavagnin, Marco ; Ismail, Bassem ; Lugstein, Alois ; Zeiner, Clemens ; Bertagnolli, Emmerich In-situ chlorine etching of nanowires by focused electron beam - a direct-modification approach for tailoring nanowire propertiesKonferenzbeitrag Inproceedings2013
18Mika, Johann ; Wanzenböck, Heinz D. ; Schwarz, Karin ; Scholze, P ; Bertagnolli, Emmerich Electrical and Morphological Properties of Neurites investigated by a Novel Microelectrode-Microfluidic DeviceKonferenzbeitrag Inproceedings2013
19Wanzenböck, Heinz D. ; Exler, Andreas ; Brezina, Alexander ; Mika, Johann ; Bertagnolli, Emmerich ; Engleder, Elisabeth ; Gabor, F ; Wirth, M In vitro characterization of human epithelial tissue utilizing a microelectronic impedance sensor with microfluidic medium supplyKonferenzbeitrag Inproceedings2013
20Mika, Johann ; Amon, Andreas ; Schwarz, Karin ; Stanger, Maximilian ; Kou, Jianqiu ; Wanzenböck, Heinz D. ; Huck, Sigismund ; Bertagnolli, Emmerich Neural electrical activity measurements of isolated axons using multi-electrode arraysKonferenzbeitrag Inproceedings2012