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Record link: 
http://hdl.handle.net/20.500.12708/101217
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Title: 
Three-point measurement in solid state devices: (Novel) artefacts and how to avoid them
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Citation: 
Huber, T., Schlesinger, R., Schmid, A., Kubicek, M., & Fleig, J. (2019). Three-point measurement in solid state devices: (Novel) artefacts and how to avoid them. Solid State Ionics 22th Meeting, PyeongChang, Korea (the Republic of). http://hdl.handle.net/20.500.12708/101217
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Publication Type: 
Presentation - Poster Presentation
en
Authors: 
Huber, Tobias 
Schlesinger, Richard 
Schmid, Alexander 
Kubicek, Markus 
Fleig, Jürgen 
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Organisational Unit: 
E164-04-3 - Forschungsgruppe Festkörperionik 
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Date (published): 
2019
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Event name: 
Solid State Ionics 22th Meeting 
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Event date: 
16-Jun-2019 - 21-Jun-2019
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Event place: 
PyeongChang, Korea (the Republic of)
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Science Branch: 
Chemie
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Appears in Collections:
Presentation

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