Title: Development of a measurement process for in situ testing of amorphous silicon thin-film multi junction photovoltaic degradation and measured data based potential comparison of second generation PVs
Language: English
Authors: Szentannai, György 
Qualification level: Diploma
Advisor: Fechner, Hubert
Issue Date: 2011
Number of Pages: 54
Qualification level: Diploma
Thin film photovoltaic cells are a widely used, second generation electricity generation system. Aside from many economical and ecological advantages, the main limitation of amorphous thin film cells is that light induced degradation occurs in the first months of sun exposure. As light induced degradation has still not been fully understood, research focus on alternative solutions. Two such products that were recently introduced and disseminated widely on the market are used as a subject to develop a comparison method in situ circumstances. The real performance and degradation of newly implemented micromorph cells were tested at private houses in Niederösterreich and in Vienna. Their productivity was economically compared with that of a hetero-junction cell. Even if, as is to be expected in an in situ trial, two locations out of four were filed, the calculated results are in parallel with the literature and are slightly behind the producers? data.
URI: https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-52710
Library ID: AC08846166
Organisation: E017 - Weiterbildungszentrum der TU Wien 
Publication Type: Thesis
Appears in Collections:Thesis

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