| Title: | Application of secondary ion mass spectrometry (SIMS) in the development of new materials | Language: | English | Authors: | Rosner, Martin | Qualification level: | Doctoral | Advisor: | Hutter, Herbert | Issue Date: | 2003 | Qualification level: | Doctoral | Keywords: | Sekundärionen-Massenspektrometrie; Werkstoffkunde | URI: | https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-10437 http://hdl.handle.net/20.500.12708/12144 |
Library ID: | AC04053610 | Organisation: | E164 - Institut für Chemische Technologien und Analytik | Publication Type: | Thesis Hochschulschrift |
| Appears in Collections: | Thesis |
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