Title: Application of secondary ion mass spectrometry (SIMS) in the development of new materials
Language: English
Authors: Rosner, Martin 
Qualification level: Doctoral
Advisor: Hutter, Herbert
Issue Date: 2003
Qualification level: Doctoral
Keywords: Sekundärionen-Massenspektrometrie; Werkstoffkunde
URI: https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-10437
http://hdl.handle.net/20.500.12708/12144
Library ID: AC04053610
Organisation: E164 - Institut für Chemische Technologien und Analytik 
Publication Type: Thesis
Hochschulschrift
Appears in Collections:Thesis

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