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Record link: 
http://hdl.handle.net/20.500.12708/125837
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Title: 
Fundamental parameter method using scattering X-rays in X-ray fluorescence analysis
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Citation: 
Kataoka, Y., Kawahara, N., Hara, S., Yamada, Y., Matsuo, T., & Mantler, M. (2005). Fundamental parameter method using scattering X-rays in X-ray fluorescence analysis. 54th Denver X-ray Conference, Denver (USA), Non-EU. http://hdl.handle.net/20.500.12708/125837
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Publication Type: 
Presentation - Conference presentation
en
Authors: 
Kataoka, Y. 
Kawahara, N. 
Hara, S. 
Yamada, Y. 
Matsuo, T. 
Mantler, Michael 
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Organisational Unit: 
E138-05 - Forschungsbereich Solid State Spectroscopy 
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Date (published): 
2005
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Event name: 
54th Denver X-ray Conference 
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Event date: 
1-Aug-2005 - 5-Aug-2005
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Event place: 
Denver (USA), Non-EU
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Science Branch: 
Physik, Mechanik, Astronomie
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Appears in Collections:
Presentation

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