Record link: 
http://hdl.handle.net/20.500.12708/139946
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Title: 
Single-pulse Laser Induced Buried Defects in Silicon Written by Ultrashort-pulse Laser at 2.1 um
en
Citation: 
Tolstik, N., Sorokin, E., Mac-Cragh, J. C., Richter, R., & Sorokina, I. T. (2022). Single-pulse Laser Induced Buried Defects in Silicon Written by Ultrashort-pulse Laser at 2.1 um. In Proceedings: Conference on Lasers and Electro-Optics. Conference on Lasers and Electro-Optics (CLEO 2022, San Jose, CA, USA), San Jose, California, United States of America (the). https://doi.org/10.1364/CLEO_AT.2022.AM4I.8
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Publisher DOI: 
10.1364/CLEO_AT.2022.AM4I.8
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
 
Konferenzbeitrag - Full-Paper Contribution
de
Language: 
English
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Authors: 
Tolstik, N. 
Sorokin, E. 
Mac-Cragh, J.C. 
Richter, R. 
Sorokina, Irina T. 
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Organisational Unit: 
E387-01 - Forschungsbereich Photonik 
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Published in: 
Proceedings: Conference on Lasers and Electro-Optics 
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Date (published): 
2022
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Event name: 
Conference on Lasers and Electro-Optics (CLEO 2022, San Jose, CA, USA) 
en
Event date: 
15-May-2022 - 20-May-2022
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Event place: 
San Jose, California, United States of America (the)
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Number of Pages: 
2
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Peer reviewed: 
Yes
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Keywords: 
Single-pulse; Ultrashort-pulse; Silicon
en
Research Areas: 
Photonics: 100%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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Appears in Collections:
Conference Paper

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