Record link: 
http://hdl.handle.net/20.500.12708/142668
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Title: 
Trap-Related Breakdown and Filamentary Conduction in Carbon Doped GaN
en
Citation: 
Koller, C., Pobegen, G., Ostermaier, C., Hecke, G., Neumann, R., Holzbauer, M., Strasser, G., & Pogany, D. (2019). Trap-Related Breakdown and Filamentary Conduction in Carbon Doped GaN. Physica Status Solidi (b), 256(6), 1800527. https://doi.org/10.1002/pssb.201800527
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Publisher DOI: 
10.1002/pssb.201800527
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Publication Type: 
Article - Original Research Article
en
Language: 
English
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Authors: 
Koller, Christian 
Pobegen, Gregor 
Ostermaier, Clemens 
Hecke, Gebhard 
Neumann, Richard 
Holzbauer, Martin 
Strasser, Gottfried 
Pogany, Dionyz 
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Organisational Unit: 
E362 - Institut für Festkörperelektronik 
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Journal: 
physica status solidi (b) 
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ISSN: 
0370-1972
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Date (published): 
2019
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Number of Pages: 
8
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Publisher: 
WILEY-V C H VERLAG GMBH
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Peer reviewed: 
Yes
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Keywords: 
Condensed Matter Physics; Electronic, Optical and Magnetic Materials
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Research Areas: 
Nanoelectronics: 100%
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Science Branch: 
Elektrotechnik, Elektronik, Informationstechnik
Physik, Astronomie
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