Record link: 
http://hdl.handle.net/20.500.12708/170265
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Title: 
Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence–X-ray Absorption Near Edge Structure analysis of arsenic
en
Citation: 
Meirer, F., Pepponi, G., Streli, C., Wobrauschek, P., Kregsamer, P., Zoeger, N., & Falkenberg, G. (2008). Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence–X-ray Absorption Near Edge Structure analysis of arsenic. Spectrochimica Acta Part B: Atomic Spectroscopy, 63(12), 1496–1502. https://doi.org/10.1016/j.sab.2008.05.004
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Publisher DOI: 
10.1016/j.sab.2008.05.004
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Publication Type: 
Article - Original Research Article
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Language: 
English
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Authors: 
Meirer, F. 
Pepponi, G. 
Streli, C. 
Wobrauschek, P. 
Kregsamer, P. 
Zoeger, N. 
Falkenberg, G. 
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Organisational Unit: 
E141-05 - Forschungsbereich Radiation Physics 
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Journal: 
Spectrochimica Acta Part B: Atomic Spectroscopy 
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ISSN: 
0584-8547
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Date (published): 
Dec-2008
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Number of Pages: 
7
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Publisher: 
PERGAMON-ELSEVIER SCIENCE LTD
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Peer reviewed: 
Yes
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Keywords: 
Atomic and Molecular Physics, and Optics; Instrumentation; Spectroscopy; Analytical Chemistry; TXRF; Xanes; Self-absorption; Arsenic
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Science Branch: 
Physik, Mechanik, Astronomie
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