Notice
This item was automatically migrated from a legacy system. It's data has not been checked and might not meet the quality criteria of the present system.
Schattschneider, P., Hébert, C., & Stöger-Pollach, M. (2006). Electron energy-loss spectrometry for metals: some thoughts beyond microanalysis. International Journal of Materials Research, 97(7), 920–927. http://hdl.handle.net/20.500.12708/172656
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie E138-03 - Forschungsbereich Functional and Magnetic Materials
-
Journal:
International Journal of Materials Research
-
ISSN:
1862-5282
-
Date (published):
2006
-
Number of Pages:
8
-
Peer reviewed:
Yes
-
Abstract:
Electron energy-loss spectrometry for metals: some thoughts beyond microanalysis
Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday
The established technique of electron energy-loss spectrometry (EELS) in the electron microscope has surpassed the task of chemical microanalysis. Some aspects of EELS, such as low energy losses for optical studies, have a long traditio...
Electron energy-loss spectrometry for metals: some thoughts beyond microanalysis
Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday
The established technique of electron energy-loss spectrometry (EELS) in the electron microscope has surpassed the task of chemical microanalysis. Some aspects of EELS, such as low energy losses for optical studies, have a long tradition and we see them re-emerge after a long period of oblivion. Other aspects such as coherence of inelastically scattered electrons are now much better understood and can be used to advantage. Many applications of EELS can and will profit from the enormous progress in instrumentation and computing capacity. In this paper we discuss some unconventional examples of EELS beyond chemical microanalysis.
From P. Schattschneider a,b | C. Hébert a | M. Stöger-Pollach b
a Institut für Festkörperphysik, Technische Universität Wien, Austria
b Univ. Service Centre for Transmission Electron Microscopy, Technische Universität Wien, Austria
Appeared in International Journal of Materials Research 2006/07, Page 920-927
