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Record link: 
http://hdl.handle.net/20.500.12708/176280
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Title: 
Simulation Analysis of the Electro-Thermal Performance of SOI FinFETs
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Citation: 
Wang, L., Sadi, T., Brown, A. R., Nedjalkov, M., Alexander, C., Cheng, B., Millar, C., & Asenov, A. (2016). Simulation Analysis of the Electro-Thermal Performance of SOI FinFETs. In V. Sverdlov & S. Selberherr (Eds.), 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS). IEEE. https://doi.org/10.1109/ulis.2016.7440051
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Publisher DOI: 
10.1109/ulis.2016.7440051
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Wang, L. 
Sadi, T. 
Brown, A. R. 
Nedjalkov, M. 
Alexander, C. 
Cheng, B. 
Millar, C. 
Asenov, A. 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) 
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Date (published): 
2016
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Number of Pages: 
4
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Publisher: 
IEEE
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Peer reviewed: 
No
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Science Branch: 
Elektrotechnik, Elektronik, Informationstechnik
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Appears in Collections:
Conference Paper

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