<div class="csl-bib-body">
<div class="csl-entry">Waltl, M. (2016). <i>Experimental characterization of bias temperature instabilities in modern transistor technologies</i> [Dissertation, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2016.38201</div>
</div>
-
dc.identifier.uri
https://doi.org/10.34726/hss.2016.38201
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/18010
-
dc.description
Zusammenfassung in deutscher Sprache
-
dc.language
English
-
dc.language.iso
en
-
dc.rights.uri
http://rightsstatements.org/vocab/InC/1.0/
-
dc.subject
Reliability
en
dc.subject
Bias Temperature Instabilities
en
dc.subject
pMOSFET
en
dc.subject
nMOSFET
en
dc.subject
NBTI
en
dc.subject
PBTI
en
dc.subject
TDDS
en
dc.title
Experimental characterization of bias temperature instabilities in modern transistor technologies