DC FieldValueLanguage
dc.contributor.advisorGrasser, Klaus-Tibor-
dc.contributor.authorWaltl, Michael-
dc.date.accessioned2021-07-07T09:12:54Z-
dc.date.issued2016-
dc.date.submitted2016-09-
dc.identifier.urihttps://doi.org/10.34726/hss.2016.38201-
dc.identifier.urihttp://hdl.handle.net/20.500.12708/18010-
dc.descriptionZusammenfassung in deutscher Sprache-
dc.formatxxxvii, 158 Seiten-
dc.languageEnglish-
dc.language.isoen-
dc.subjectReliabilityen
dc.subjectBias Temperature Instabilitiesen
dc.subjectpMOSFETen
dc.subjectnMOSFETen
dc.subjectNBTIen
dc.subjectPBTIen
dc.subjectTDDSen
dc.titleExperimental characterization of bias temperature instabilities in modern transistor technologiesen
dc.typeThesisen
dc.typeHochschulschriftde
dc.identifier.doi10.34726/hss.2016.38201-
dc.publisher.placeWien-
tuw.thesisinformationTechnische Universität Wien-
tuw.publication.orgunitE360 - Institut für Mikroelektronik-
dc.type.qualificationlevelDoctoral-
dc.identifier.libraryidAC13328705-
dc.description.numberOfPages158-
dc.thesistypeDissertationde
dc.thesistypeDissertationen
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openaccessfulltextOpen Access-
item.openairetypeThesis-
item.openairetypeHochschulschrift-
item.fulltextwith Fulltext-
item.languageiso639-1en-
item.grantfulltextopen-
item.cerifentitytypePublications-
item.cerifentitytypePublications-
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