DC Field
Value
Language
dc.contributor.advisor
Grasser, Klaus-Tibor
-
dc.contributor.author
Waltl, Michael
-
dc.date.accessioned
2021-07-07T09:12:54Z
-
dc.date.issued
2016
-
dc.date.submitted
2016-09
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Waltl, M. (2016). <i>Experimental characterization of bias temperature instabilities in modern transistor technologies</i> [Dissertation, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2016.38201</div> </div>
-
dc.identifier.uri
https://doi.org/10.34726/hss.2016.38201
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/18010
-
dc.description
Zusammenfassung in deutscher Sprache
-
dc.language
English
-
dc.language.iso
en
-
dc.rights.uri
http://rightsstatements.org/vocab/InC/1.0/
-
dc.subject
Reliability
en
dc.subject
Bias Temperature Instabilities
en
dc.subject
pMOSFET
en
dc.subject
nMOSFET
en
dc.subject
NBTI
en
dc.subject
PBTI
en
dc.subject
TDDS
en
dc.title
Experimental characterization of bias temperature instabilities in modern transistor technologies
en
dc.type
Thesis
en
dc.type
Hochschulschrift
de
dc.rights.license
In Copyright
en
dc.rights.license
Urheberrechtsschutz
de
dc.identifier.doi
10.34726/hss.2016.38201
-
dc.contributor.affiliation
TU Wien, Österreich
-
dc.rights.holder
Michael Waltl
-
dc.publisher.place
Wien
-
tuw.version
vor
-
tuw.thesisinformation
Technische Universität Wien
-
tuw.publication.orgunit
E360 - Institut für Mikroelektronik
-
dc.type.qualificationlevel
Doctoral
-
dc.identifier.libraryid
AC13328705
-
dc.description.numberOfPages
158
-
dc.thesistype
Dissertation
de
dc.thesistype
Dissertation
en
tuw.author.orcid
0000-0001-6042-759X
-
dc.rights.identifier
In Copyright
en
dc.rights.identifier
Urheberrechtsschutz
de
item.languageiso639-1
en
-
item.openairetype
doctoral thesis
-
item.grantfulltext
open
-
item.fulltext
with Fulltext
-
item.cerifentitytype
Publications
-
item.mimetype
application/pdf
-
item.openairecristype
http://purl.org/coar/resource_type/c_db06
-
item.openaccessfulltext
Open Access
-
crisitem.author.dept
E360-01 - Forschungsbereich Mikroelektronik
-
crisitem.author.orcid
0000-0001-6042-759X
-
crisitem.author.parentorg
E360 - Institut für Mikroelektronik
-
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