Record link: 
http://hdl.handle.net/20.500.12708/181247
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Title: 
In-situ ellipsometry of thin films at solid/liqid interfaces
en
Citation: 
Kattner, J. (2002). In-situ ellipsometry of thin films at solid/liqid interfaces [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/181247
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CatalogPlus: 
AC03466112
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Publication Type: 
Thesis - Dissertation
en
 
Hochschulschrift - Dissertation
de
Language: 
English
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Authors: 
Kattner, Jürgen 
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Advisor: 
Hoffmann, Helmuth 
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Organisational Unit: 
E163 - Institut für Angewandte Synthesechemie 
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Date (published): 
2002
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Number of Pages: 
97
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Keywords: 
Dünne Schicht; Grenzfläche; Festkörper; Flüssigkeit; Ellipsometrie
de
Additional information: 
Zsfassung in dt. Sprache
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Appears in Collections:
Thesis

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