Record link: 
http://hdl.handle.net/20.500.12708/181284
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Title: 
TEM analysis of GaN/GaAIN on SiC and sapphire
en
Citation: 
Korkmaz, M. (2002). TEM analysis of GaN/GaAIN on SiC and sapphire [Diploma Thesis, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/181284
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CatalogPlus: 
AC03466646
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Publication Type: 
Thesis - Diplomarbeit
en
Language: 
English
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Authors: 
Korkmaz, Metin 
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Advisor: 
Pongratz, Peter 
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Organisational Unit: 
E138 - Institut für Festkörperphysik 
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Date (published): 
2002
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Number of Pages: 
97
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Appears in Collections:
Thesis

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