Record link: 
http://hdl.handle.net/20.500.12708/181562
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Title: 
Investigation of internal behavior in CMOS ESD protection devices under high current stress
en
Citation: 
Litzenberger, M. (2003). Investigation of internal behavior in CMOS ESD protection devices under high current stress [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/181562
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CatalogPlus: 
AC03817663
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Publication Type: 
Thesis - Dissertation
en
 
Hochschulschrift - Dissertation
de
Language: 
English
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Authors: 
Litzenberger, Martin 
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Advisor: 
Gornik, Erich 
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Organisational Unit: 
E362 - Institut für Festkörperelektronik 
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Date (published): 
2003
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Number of Pages: 
169
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Keywords: 
CMOS-Schaltung; Transistor; Elektrostatische Entladung; Schutz; Interferometrie; Ausgleichsvorgang
de
Additional information: 
Zsfassung in dt. Sprache
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Appears in Collections:
Thesis

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