Record link: 
http://hdl.handle.net/20.500.12708/189214
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Title: 
Bias Spectroscopy of Negative Differential Resistance in Ge Nanowire Field Effect Transistors
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Citation: 
Behrle, R., Lugstein, A., den Hertog, M., Weber, W. M., & Sistani, M. (2023). Bias Spectroscopy of Negative Differential Resistance in Ge Nanowire Field Effect Transistors. In Nanowire Week 2023 : Conference Information & Abstracts (pp. 43–43).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Behrle, Raphael 
Lugstein, Alois 
den Hertog, M. 
Weber, Walter Michael 
Sistani, Masiar 
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Organisational Unit: 
E362-02 - Forschungsbereich Nanoelektronische Bauelemente 
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Published in: 
Nanowire Week 2023 : Conference Information & Abstracts 
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Date (published): 
10-Oct-2023
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Event name: 
Nanowire Week 2023 
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Event date: 
9-Oct-2023 - 13-Oct-2023
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Event place: 
Atlanta, United States of America (the)
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Number of Pages: 
1
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Keywords: 
bias; Spectroscopy; Ge
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Nanowire; field effect transistor
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Research Areas: 
Materials Characterization: 50%
Surfaces and Interfaces: 50%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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Appears in Collections:
Conference Paper

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