Record link: 
http://hdl.handle.net/20.500.12708/191062
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Title: 
Plasmonic-Based Non-Invasive In-Operando Technique for the Characterization of Mos₂ Nanoswitches
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Citation: 
Symonowicz, J., Polyushkin, D., Mueller, T., & Martino, G. D. (2023). Plasmonic-Based Non-Invasive In-Operando Technique for the Characterization of Mos₂ Nanoswitches. In European Quantum Electronics Conference : part of Conference on Lasers and Electro-Optics/Europe (CLEO/Europe 2023) and European Quantum Electronics Conference. 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), München, Germany. IEEE Explore. https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.10231942
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Publisher DOI: 
10.1109/CLEO/Europe-EQEC57999.2023.10231942
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Publication Type: 
Inproceedings - Full-Paper Contribution
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Language: 
English
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Authors: 
Symonowicz, Joanna 
Polyushkin, Dmitry 
Mueller, Thomas 
Martino, Giuliana Di 
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Organisational Unit: 
E387 - Institut für Photonik 
E387-01 - Forschungsbereich Photonik 
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Published in: 
European Quantum Electronics Conference : part of Conference on Lasers and Electro-Optics/Europe (CLEO/Europe 2023) and European Quantum Electronics Conference 
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ISBN: 
979-8-3503-4599-5
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Date (published): 
2023
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Event name: 
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) 
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Event date: 
26-Jun-2023 - 30-Jun-2023
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Event place: 
München, Germany
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Number of Pages: 
2
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Publisher: 
IEEE Explore
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Peer reviewed: 
Yes
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Keywords: 
MoS2/bin; plasmonics; nanofabrication
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Abstract: 
2D materials such as MoS2 remain one of the most important topics in materials industry [1]. MoS2 nanoswitches have shown superb ultralow switching energies [2] without excessive leakage currents [3]. However, the debate about the origin and volatility of electrical switching was unresolved due to the lack of adequate nanoimaging of devices in-operando [4].
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Research Areas: 
Materials Characterization: 20%
Photonics: 60%
Sensor Systems: 20%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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Appears in Collections:
Conference Paper

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