Record link: 
http://hdl.handle.net/20.500.12708/191472
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Title: 
Identifying Electrically Active Dislocations in GaN and the Challenge of Cross-Correlative Physical Characterization
en
Citation: 
Scales, Z., Koller, C. M., Schoemann, S., Nelhiebel, M., Reisinger, M., Jatzkowski, J., Diehle, P., & Stöger-Pollach, M. (2023, November 13). Identifying Electrically Active Dislocations in GaN and the Challenge of Cross-Correlative Physical Characterization [Conference Presentation]. ISTFA 2023, Phoenix, United States of America (the). http://hdl.handle.net/20.500.12708/191472
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Publication Type: 
Presentation - Conference Presentation
en
Language: 
English
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Authors: 
Scales, Ze 
Koller, Christian Martin 
Schoemann, Stephan 
Nelhiebel, Michael 
Reisinger, Michael 
Jatzkowski, Joerg 
Diehle, Patrick 
Stöger-Pollach, Michael 
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Organisational Unit: 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
E138 - Institut für Festkörperphysik 
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Date (published): 
13-Nov-2023
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Event name: 
ISTFA 2023 
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Event date: 
12-Nov-2023 - 16-Nov-2023
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Event place: 
Phoenix, United States of America (the)
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Keywords: 
Electrically Active Dislocations
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Research facilities: 
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie 
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Link (external): 
https://asm.confex.com/asm/istfa23/webprogram/Paper59261.html
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Research Areas: 
Materials Characterization: 50%
Surfaces and Interfaces: 30%
Structure-Property Relationsship: 20%
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Science Branch: 
1040 - Chemie: 30%
2100 - Nanotechnologie: 40%
1030 - Physik, Astronomie: 30%
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Appears in Collections:
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